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Home > News > Ascentest News > Detailed Ascentest News
Ascentest joins the 2012 Agilent Measurement Forum in Shanghai.
Time:2012-03-28    Source:Ascentest

On Mar. 27th, Ascentest joined the 2012 Agilent Test & Measurement Forum in Shanghai.

Ascentest exhibited test solutions for Wireless and RF / Microwave, as well as parallel data acquisition.

 

The exhibition of AT102 Turbine Speedometer Monitoring System, based on Agilent PXI instruments:

 

Ascentest also introduced AT800 RF Pre-conformance Test System & AT900 Instrument Calibration Test System to the visitors.

          
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