AT105 System consists of Agilent ENA/PAN/PNA-L Network Analyzer and Ascentest customized accessories and software for testing thin-film Electroagnetic Wave Shileding/Absorbing Materials.

With its user-friendly "Test Wizard" software, AT105 system automatically tests the following key parameters of the MUT(Material Under Test):

1. Shielding Effect: 30MHz~1.5GHz, according to ASTM 4935, GJB 6190-2008 & SJ20524-1995.
2. Permeability/Permittivity: 100MHz~18GHz
3. Reflection Loss/Attenuation: 45MHz~10GHz
4. Power Loss: 45MHz~6GHz

1. A total solution for testing 4 categories of critial parameters for EM Shileding/Absorbing Materials.
2. Cost-effective: only one network analyzer is needed.
3. Automatic testing with Test Wizard, fast & convenient for entry-level operators.
4. Proven test result for material R&D testing.