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| Related products |
MPS-Tester Multi-port Vector Network Analysis System
MPS-Tester system expands 2-port Vector Network Analyzer to 4 / 8 / 12 /24 or more ports for accurate vector network analysis on multi-port RF / Microwave components, up to 40GHz.
MPS-Tester system consists of MPS (Multi-Port Switch Matrix), 2-port VNA, and system software.
Our proprietary Multi-port Calibration Algorithm significantly improves the system's accuracy for testing multi-port components up to 40GHz.
The system, as an ideal substitute for expensive 4-port and 8-port VNA, is a cost-effective test tool for testing multi-port DUT, such as Smart Antennas, Base Station Diplexers, Directional Couplers, Hybrid Couplers, Power Combiners / Splitters, Circulators, and other multi-port RF / Mirowave components and modules.
HSCT USB4 Type-C Cable Test System
HSCT-C is dedicated fully automatic test system for USB3.1 Type-C cables. HSCT system is built upon the platform of Ascentest HSCT High-Speed Cable Test System. The system is based on the functions of Keysight E5071C (Opt. 4K5, TDR) and Ascentest MPS-HSCT Multi-Port Switch Matrix. The system automatically and accurately tests the Frequency & Time Domain parameters for USB3.1 Type-C cable assemblies, which greatly speeds up the tests and lowers the test cost.
OMTS Optical Transceiver Module Test System
OMTS (Optical transceiver Module Test System) is based upon Ascentest MPS 4x16 Multi-Port RF/uWave Switch Matrix and Ascentest’s proven automatic test platform, implementing the measuring power of Optical Power Meter, Optical Attenuator, Wide-band Oscilloscope, BERT and DC Power Supply, to automatically perform the full 4-channel test for the 40Gbps QSFP+ Optical Transceiver Modules, up to 40GHz.
HSCT High-Speed Cable Test System
HSCT system is based on the functions of Agilent E5071C (Opt. TDR) and Ascentest MPS-HSCT Multi-Port Switch Matrix. The system automatically and accurately tests the Frequency & Time Domain parameters as well as Eye Diagram for high speed cables up to 100Gbps, such as QSFP28/QSFP+/SFP+/MiniSAS/HDMI, etc.
AT890 Compliance Test System for 2.4GHz & 5GHz Wireless Devices
Ascentest Releases AT890 Test System for EN 300 328 V1.8.1 & EN 301 893 V1.7.1 on Sep. 1st, 2014.
AT890 systetm is accurate, convenient, flexible, and cost-effective test tool for Test Labs and Wireless Manufacturers to validate 2.4GHz & 5GHz devices according to the new standards.
VMNA (Virtual Multi-port Network Analyzer) Test System
VMNA system is built upon Ascentest high-speed solid-state RF Switch Matrix (100MHz ~ 8GHz), which expands a 2-port Vector Network Analyzer to 8-port or 16-port Vector Network Analysis System.
Due to the system’s ultra high-speed switching and sweeping measurement, all the operators at the 16 ports virtually feel like they are using that single 2-port Vector Network Analyzer exclusively!
This is why this system is named as “Virtual Multi-port Network Analyzer”, or VMNA as abbreviation.
AT105 EM Shileding/Absorbing Material Test System
AT105 Electroagnetic Wave Shileding/Absorbing Material Test System consists of Agilent ENA/PAN/PNA-L Network Analyzer and Ascentest customized accessories and software.
The system automatically tests the following key parameters of the MUT(Material Under Test): Shielding Effect, Permeability/Permittivity, Reflection Loss/Attenuation, Power Loss.
AT500 Wireless Terminal Production Test Systems
Wireless Terminals, such as mobile phones, smart phones and PADs, are integrating more and more functions including Wireless Technologies such as 2G/3G/WiFi/Bluetooth/A-GPS/FM, etc.
However, the product's life cycle is becoming shorter and shorter, with much more competition and less profit margin, while the labor cost of production operators is rising sharply.
Therefore, the wireless terminal manufacturers are pushing to reduce production cost even more imperatively.
Ascentest AT500 Series Production Systems are the right solutions to those needs for production cost reduction without compromising product quality, by implementing production automation and informatization, making full use of expensive instruments and optimizing production procedures.
AT510 RF Test System
AT510 is RF Calibration / Final Test System for Production of Wireless Terminals, such as mobile phones, smart phones and PADs, etc.
The system implements Non-Signaling test method to improve production efficient for Bard Test of 2G/3G/WiFi/Bluetooth/A-GPS/FM, etc.
AT510 system supports both old and new models of instruments, to increase the utilization of the expensive test equipment, and improve the flexibility for customer’s production investment plan, such as instruments rental.
AT510 system reduces the cost of production not only by improving efficiency, but also by optimizing test procedures, stabilizing the product quality, and reducing the need for operators in production lines.
AT510 system can be controlled by Ascentest PIMS (Production Information Management System) for data collection and production / factory management (Shop Floor Management), to upgrade the production management level.
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| Product features and technical data: |
| System overview |
AT105 System consists of Agilent ENA/PAN/PNA-L Network Analyzer and Ascentest customized accessories and software for testing thin-film Electroagnetic Wave Shileding/Absorbing Materials.
With its user-friendly "Test Wizard" software, AT105 system automatically tests the following key parameters of the MUT(Material Under Test):
1. Shielding Effect: 30MHz~1.5GHz, according to ASTM 4935, GJB 6190-2008 & SJ20524-1995.
2. Permeability/Permittivity: 100MHz~18GHz
3. Reflection Loss/Attenuation: 45MHz~10GHz
4. Power Loss: 45MHz~6GHz |
| Function characteristics |
1. A total solution for testing 4 categories of critial parameters for EM Shileding/Absorbing Materials.
2. Cost-effective: only one network analyzer is needed.
3. Automatic testing with Test Wizard, fast & convenient for entry-level operators.
4. Proven test result for material R&D testing. |
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| System structure |
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| Software structure |
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| Order information( Contact us) |
| AT105 EM Shileding/Absorbing Material Test System |
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